SPEA DOT800T Electrical Characteristic Testing System for Power Devices
The DOT800T electric characteristic testing system for power devices, manufactured by SPEA, is an all-in-one tester that handles all necessary electrical characteristic tests for power devices in a single unit. It can perform ISO, AC, and DC tests for all power device applications, from wafer level, chip level, DBC/AMB level, to final package level, using the DOT800T. The DOT800T supports testing not only for traditional silicon devices (Si devices) but also for gallium nitride devices (GaN devices) and silicon carbide devices (SiC devices), covering their testing and measurement ranges with high voltage and high current output modules, as well as high-frequency and low current measurement functions. To ensure quality and reliability, a complete and accurate dynamic test (AC test), static test (DC test), and insulation test (ISO test) sequence is used to verify correct device operation under actual usage conditions. All these features are designed for mass production environments, achieving a high-throughput, modular, and flexible configuration tester.
